Hardware-in-the-loop (HIL) testing is a test methodology that can be used throughout the development of real-time embedded controllers to reduce development time and improve the effectiveness of testing.
As the complexity of electronic control modules (ECMs) increases, the number of combinations of tests required to ensure correct functionality and response increases exponentially. Older testing methodologies tended to wait for the controller design to be completed and integrated into the final system before system issues could be identified.
Hardware-in-the-loop testing provides a way of simulating sensors, actuators and mechanical components in a way that connects all the I/O of the ECM being tested, long before the final system is integrated. It does this by using representative real-time responses, electrical stimuli and functional use cases.
The part of the simulation that represents the environment, sensors and associated hardware is called the plant model. With Genix, this is usually a Simulink® model within a target, that controls the I/O delivered to the device under test. Additional I/O can be added and configured through the Genix distributed systems range, or third party hardware and software.
Genix systems can comprise of as little as distributed intelligent signal generators to full hardware-in-the-loop test systems. The Genix Target runs a Simulink®-coded plant model within a system, and offers up to 160 onboard I/O. Genix Sub-racks can slot into racks, and can contain power supplies, PODs and cards. Genix cards offer functionality such as load simulation, communication switching and much more. Genix PODs contain Genix modules, and offer interfacing to real-world I/O and are fully configurable in software. A range of distributed units can generate custom vehicle signals such as crankshaft and camshaft sensors, or wheel speed sensors.
Signal conditioning boards offer a wide range of flexibility and reconfiguration, as well as some special-purpose I/O. All Genix signal conditioning is configurable in software using our HIL configuration utility, HCU.
Genix systems can be upgraded with vehicle battery simulation units that can generate stop start voltage, voltage dropout, FTBN and other useful waveforms in a randomised yet repeatable fashion.
Genix offers rack-based or remote I/O, simulating sensors, actuators, engine activity and more, allowing more testing to be completed in the lab. Sub-racks are built in our factory and then commissioned on-site.
A wide range of special purpose modules are available, offering the functionality to insert faults, simulate loads, perform switching and much more. add2 can provide or develop specialised functionality on request.
An all-in-one solution for integrating PC chassis and signal conditioning cards within a 3U rack-based solution. Re-configurable in software, the number of I/O required can be simplified, minimising test complexity.
Genix technology allows engineers to quickly scale the capability of their HIL environments in response to increasing or changing test requirements, by delivering broad test functionality including fault insertion, load simulation and custom distributed signalling. It also allows simple switching between one system under test to the next, with all signal conditioning defined in software. This allows test environments to be swiftly repurposed as requirements change.
Full compatibility with industry standard tools such as MATLAB Simulink® allows engineers to quickly adapt and use Genix technology as part of their HIL testing. This allows OEMs and Tier 1 suppliers to broaden test capability and switch quickly between vehicle programs and test methodologies.
Genix offers high levels of interoperability with third-party systems, and can be integrated with vehicle dynamics software and test automation software. Compatibility is also available with existing add2 products such as Sens-X for current measurement and LVTGO-VBS for robustness testing.
• Hardware-in-the-loop testing
• Rapid Control Prototyping
• Component robustness testing
• Verification and Validation testing
• Electrical load profiling
• Model-in-the-loop testing